Lu, Darsen D.: search on Z-Library

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1

Arrays of single-walled carbon nanotubes with full surface coverage for high-performance electronics

Cao, Qing, Han, Shu-jen, Tulevski, George S., Zhu, Yu, Lu, Darsen D., Haensch, Wilfried

Journal:

Nature Nanotechnology

Year:

2013

Language:

english

File:

PDF, 2.18 MB

english, 2013

2

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Compact modeling of flicker noise variability in small size MOSFETs

Morshed, Tanvir H., Dunga, Mohan V., Zhang, Jodie, Lu, Darsen D., Niknejad, Ali M., Hu, Chenming

Year:

2009

Language:

english

File:

PDF, 457 KB

english, 2009

3

BSIM-CG: A compact model of cylindrical/surround gate MOSFET for circuit simulations

S. Venugopalan, Darsen D. Lu, Yukiya Kawakami, Peter M. Lee, Ali M. Niknejad, Chenming Hu

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1.74 MB

english, 2012

4

[IEEE 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2011.04.25-2011.04.27)] Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications - BSIM-CG: A compact model of cylindrical gate / nanowire MOSFETs for circuit simulations

Sriramkumar, V., Lu, Darsen D., Morshed, Tanvir H., Kawakami, Yukiya, Lee, Peter M., Niknejad, Ali M., Hu, Chenming

Year:

2011

Language:

english

File:

PDF, 421 KB

english, 2011

5

[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - BSIM-MG: A Versatile Multi-Gate FET Model for Mixed-Signal Design

Dunga, Mohan V., Lin, Chung-Hsun, Lu, Darsen D., Xiong, Weize, Cleavelin, C. R., Patruno, P., Hwang, Jiunn-Ren, Yang, Fu-Liang, Niknejad, Ali M., Hu, Chenming

Year:

2007

Language:

english

File:

PDF, 884 KB

english, 2007

6

A computationally efficient compact model for fully-depleted SOI MOSFETs with independently-controlled front- and back-gates

Darsen D. Lu, Mohan V. Dunga, Chung-Hsun Lin, Ali M. Niknejad, Chenming Hu

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 1.36 MB

english, 2011

7

An FET With a Source Tunneling Barrier Showing Suppressed Short-Channel Effects for Low-Power Applications

Hsieh, Yu-Feng, Chen, Si-Hua, Chen, Nan-Yow, Lee, Wen-Jay, Tsai, Jyun-Hwei, Chen, Chun-Nan, Chiang, Meng-Hsueh, Lu, Darsen D., Kao, Kuo-Hsing

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.39 MB

english, 2018

8

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Design of FinFET SRAM Cells Using a Statistical Compact Model

Lu, Darsen D., Lin, Chung-Hsun, Yao, Shijing, Xiong, Weize, Bauer, Florian, Cleavelin, Cloves R., Niknejad, Ali M., Hu, Chenming

Year:

2009

Language:

english

File:

PDF, 505 KB

english, 2009

9

[IEEE 2011 IEEE International SOI Conference - Tempe, AZ, USA (2011.10.3-2011.10.6)] IEEE 2011 International SOI Conference - An exercise of ET/UTBB SOI CMOS modeling and simulation with BSIM-IMG

Chen, Qiang, Zhong, Xinghua, Wu, Yanjun, Zhu, Nengyong, Huang, Wei, Lu, Darsen, Hu, Chenming, Nguyen, Bich-Yen, Faynot, Olivier

Year:

2011

Language:

english

File:

PDF, 435 KB

english, 2011

10

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Global parameter extraction for a multi-gate MOSFETs compact model

Yao, Shijing, Morshed, Tanvir H., Lu, Darsen D., Venugopalan, Sriramkumar, Xiong, Weize, Cleavelin, C. R., Niknejad, Ali M., Hu, Chenming

Year:

2010

Language:

english

File:

PDF, 1.27 MB

english, 2010

11

Meeting the Challenge of Multiple Threshold Voltages in Highly Scaled Undoped FinFETs

Muralidhar, Ramachandran, Cai, Jin, Frank, David J., Oldiges, Phil, Lu, Darsen, Lauer, Isaac

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 649 KB

english, 2013

12

[IEEE 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Millbrae, CA, USA (2014.10.6-2014.10.9)] 2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Dielectric isolated FinFETs on bulk substrate

Lu, Darsen, Cheng, Kangguo, Morin, Pierre, Loubet, Nicolas, Hook, Terence, Guo, Dechao, Khakifirooz, Ali, Oldiges, Phil, Doris, Bruce, Rim, Ken, Jacob, Ajey, Bu, Huiming, Khare, Mukesh

Year:

2014

Language:

english

File:

PDF, 805 KB

english, 2014

13

FinFET with Encased Air-Gap Spacers for High-Performance and Low-Energy Circuits

Sachid, Angada B., Huang, Yao-Min, Chen, Yi-Ju, Chen, Chun-Chi, Lu, Darsen D., Chen, Min-Cheng, Hu, Chenming

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 885 KB

english, 2016

14

Effects of Forming Gas Annealing and Channel Dimensions on the Electrical Characteristics of FeFETs and CMOS Inverter

Sung, Po-Jung, Su, Chun-Jung, Lo, Shih-Hsuan, Hsueh, Fu-Kuo, Lu, Darsen D., Lee, Yao-Jen, Chao, Tien-Sheng

Journal:

IEEE Journal of the Electron Devices Society

Year:

2020

File:

PDF, 1.84 MB

2020

15

[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - BSIM-IMG: A Turnkey compact model for fully depleted technologies

Hu, Chenming, Niknejad, Ali, Sriramkumar, V., Lu, Darsen, Chauhan, Yogesh, Kahm, Muhammed, Sachid, Angada

Year:

2012

Language:

english

File:

PDF, 4.45 MB

english, 2012

16

[IEEE 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Penang, Malaysia (2020.4.6-2020.4.21)] 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Ultralow Power Neuromorphic Accelerator for Deep Learning Using Ni/HfO 2 /TiN Resistive Random Access Memory

Le, Hoang-Hiep, Hong, Wei-Chen, Du, Jian-Wei, Lin, Tsung-Han, Hong, Yi-Xiu, Chen, I-Hsuan, Lee, Wen-Jay, Chen, Nan-Yow, Lu, Darsen D.

Year:

2020

File:

PDF, 1.14 MB

2020

17

Automated extraction of barrier heights for asymmetric MIM tunneling diodes

Lin, Wallace, Lu, Darsen D., Hong, Yi-Xiu, Hsu, Wei-Chou

Journal:

Solid-State Electronics

Year:

2020

File:

PDF, 1.14 MB

2020

18

Compact Modeling of Variation in FinFET SRAM Cells

Lu, Darsen, Lin, Chung-Hsun, Niknejad, Ali, Hu, Chenming

Journal:

IEEE Design & Test of Computers

Year:

2011

Language:

english

File:

PDF, 729 KB

english, 2011

19

[IEEE 2017 International Conference on Applied System Innovation (ICASI) - Sapporo, Japan (2017.5.13-2017.5.17)] 2017 International Conference on Applied System Innovation (ICASI) - NVMLearn: A simulation platform for non-volatile-memory-based deep learning hardware

Lu, Darsen D., Liang, Fu-Xiang, Wang, Yi-Ci, Zeng, Huai-Kuan

Year:

2017

Language:

english

File:

PDF, 336 KB

english, 2017

20

Computationally efficient compact model for ferroelectric field-effect transistors to simulate the online training of neural networks

Lu, Darsen, De, Sourav, Baig, Mohammad Aftab, Qiu, Bo-Han, Lee, Yao-Jen

Journal:

Semiconductor Science and Technology

Year:

2020

File:

PDF, 516 KB

2020

21

[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - A comparative study of fin-last and fin-first SOI FinFETs

Lu, Darsen, Chang, Josephine, Guillorn, Michael A., Lin, Chung-Hsun, Johnson, Jeffrey, Oldiges, Philip, Rim, Ken, Khare, Mukesh, Haensch, Wilfried

Year:

2013

Language:

english

File:

PDF, 910 KB

english, 2013

22

Compact model for PZT ferroelectric capacitors with voltage dependent switching behavior

Wang, Chien-wei, Ku, Hansol, Cheng Yan, Chiu, De, Sourav, Qiu, Bo-Han, Shin, Changhwan, Lu, Darsen

Journal:

Semiconductor Science and Technology

Year:

2020

File:

PDF, 469 KB

2020

23

[IEEE 2020 Device Research Conference (DRC) - Columbus, OH, USA (2020.6.21-2020.6.24)] 2020 Device Research Conference (DRC) - Tri-Gate Ferroelectric FET Characterization and Modelling for Online Training of Neural Networks at Room Temperature and 233K

De, Sourav, Baig, Md. Aftab, Qiu, Bo-Han, Lu, Darsen, Sung, Po-Jung, Hsueh, Fu.K, Lee, Yao-Jen, Su, Chun-Jung

Year:

2020

File:

PDF, 2.21 MB

2020

24

Multifinger Embedded T-Shaped Gate Graphene RF Transistors With High $f_{\rm MAX}/f_{T}$ Ratio

Han, Shu-Jen, Oida, Satoshi, Jenkins, Keith A., Lu, Darsen, Zhu, Yu

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 705 KB

english, 2013

25

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - High fMAX/fT ratio in multi-finger embedded T-shaped gate graphene transistors

Han, Shu-Jen, Oida, Satoshi, Jenkins, Keith A., Lu, Darsen D.

Year:

2013

Language:

english

File:

PDF, 835 KB

english, 2013

26

[IEEE 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2008.04.21-2008.04.23)] 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Statistical Compact Modeling of Variations in Nano MOSFETs

Lin, Chung-Hsun, Dunga, Mohan V., Lu, Darsen, Niknejad, Ali M., Hu, Chenming

Year:

2008

Language:

english

File:

PDF, 1.50 MB

english, 2008

27

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - A Multi-Gate MOSFET Compact Model Featuring Independent-Gate Operation

Lu, Darsen D., Dunga, Mohan V., Lin, Chung-Hsun, Niknejad, Ali M., Hu, Chenming

Year:

2007

Language:

english

File:

PDF, 3.67 MB

english, 2007

28

[IEEE 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2017.4.24-2017.4.27)] 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Stressor design for FinFETs with air-gap spacers

Lu, Darsen D., Angada B. Sachid,, Yao-Min Huang,, Yi-Ju Chen,, Chun-Chi Chen,, Min-Cheng Chen,, Chenming Hu,

Year:

2017

Language:

english

File:

PDF, 571 KB

english, 2017

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